Profiling of proton beams by fluence scanners

Profiling of particle beams is one the most important diagnostic procedures for operating any kind accelerator. In this work, proton beam profilers, based on fluence measurements performed by recording changes carrier lifetime in Si material and scintillation intensity thin GaN layers, caused radiation induced defects emission centres, are presented. The penetrative (26 GeV/c) stopped (1.6 MeV) protons have been examined. It shown that regime should be employed to appropriately record 2D distribution profiles. also illustrated presented profiling techniques can applied scanning other charged (namely, pions) neutral (neutrons) beams.